Method and apparatus for detection and prevention of bulk...

Details Method and apparatus for detection and prevention of bulk... Method and apparatus for detection and prevention of bulk...

2006-01-19

2008-03-25

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07348793

ABSTRACT:
A method and apparatus are provided for detection and prevention of bulk complementary metal oxide semiconductor (CMOS) latchup. A separate power distribution is provided for coupling a positive voltage supply rail to the N well and a ground voltage supply rail to the P well of the CMOS circuit. At least one sensor monitors current flow in a bias voltage applied to at least one of an N well and a P well of the CMOS circuitry. A latchup event is detected responsive to a predefined increase in the monitored current flow. A switch temporarily interrupts the connection of at least one of the N well and the P well to the respective voltage supply rail when the latchup event is detected.

REFERENCES:
patent: 4594633 (1986-06-01), Townsend et al.
patent: 5159518 (1992-10-01), Roy
patent: 5212616 (1993-05-01), Dhong et al.
patent: 5909181 (1999-06-01), Golzmane
patent: 6064555 (2000-05-01), Czajkowski et al.

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