Test system for testing integrated circuits and a method for...

Details Test system for testing integrated circuits and a method for... Test system for testing integrated circuits and a method for...

2006-02-03

2008-09-23

Nguyen, Vinh P (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07427870

ABSTRACT:
The invention relates to a test system for testing connectable integrated circuits. A particular test system may have switching devices via which a respective assigned one of the integrated circuits can be connected to the supply unit, a control unit for controlling the switching devices, and a determination unit in order to determine an item of information about a power consumption of an integrated circuit to be measured. The control unit, depending on the information, may switch the switching device in order to connect the integrated circuit to be measured to the supply unit or to isolate it from the supply unit.

REFERENCES:
patent: 6043672 (2000-03-01), Sugasawara
patent: 6411116 (2002-06-01), DeHaven et al.
patent: 6791344 (2004-09-01), Cook et al.
patent: 2002/0190707 (2002-12-01), Farnworth et al.
patent: 10133261 (2003-01-01), None
patent: 10202904 (2003-09-01), None

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