Predictive emissions monitoring method

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Chemical analysis

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C702S062000

Reexamination Certificate

active

07421348

ABSTRACT:
A method for predicting emissions from an emissions source. Test values of process variables relating to operation of the emissions source are gathered, along with corresponding time-correlated test values of the emissions variable to be predicted. Using the test values of the process variables, test values of a plurality of first coefficients are calculated for each process variable and associated with the process variable, and test values of a plurality of second coefficients are calculated for each value of each process variable and associated with the value of the process variable. Comparison values of the process variables relating to operation of the emissions source are gathered, along with corresponding time-correlated comparison values of the emissions variable to be predicted. Using the comparison values of the process variables, comparison values of a plurality of first coefficients are calculated for each process variable and associated with the process variable, and comparison values of a plurality of second coefficients are calculated for each value of each process variable and associated with the value of the process variable. Predetermined combinations of the comparison values of the variables and their associated coefficients are then iteratively compared with the test values of the respective variables and associated coefficients. Where the comparison yields matches between the comparison values and test values of the variables and their associated coefficients, the test values of the emissions variable associated with the matched test values of the variables are averaged and assigned as a predicted value of the emissions variable.

REFERENCES:
patent: 4161883 (1979-07-01), Laird et al.
patent: 4584654 (1986-04-01), Crane
patent: 4858147 (1989-08-01), Conwell
patent: 4884217 (1989-11-01), Skeirik et al.
patent: 4907167 (1990-03-01), Skeirik
patent: 4910691 (1990-03-01), Skeirik
patent: 4920499 (1990-04-01), Skeirik
patent: 4922412 (1990-05-01), Lane et al.
patent: 4928484 (1990-05-01), Peczkowski
patent: 4965742 (1990-10-01), Skeirik
patent: 4972363 (1990-11-01), Nguyen et al.
patent: 4979126 (1990-12-01), Pao et al.
patent: 5006992 (1991-04-01), Skeirik
patent: 5023045 (1991-06-01), Watanabe et al.
patent: 5025499 (1991-06-01), Inoue et al.
patent: 5038269 (1991-08-01), Grimble et al.
patent: 5058043 (1991-10-01), Skeirik
patent: 5088314 (1992-02-01), Takashi
patent: 5113483 (1992-05-01), Keeler et al.
patent: 5119287 (1992-06-01), Nakamura et al.
patent: 5119468 (1992-06-01), Owens
patent: 5121467 (1992-06-01), Skeirik
patent: 5142612 (1992-08-01), Skeirik
patent: 5150682 (1992-09-01), Magnet
patent: 5167009 (1992-11-01), Skeirik
patent: 5175678 (1992-12-01), Frerichs et al.
patent: 5197114 (1993-03-01), Skeirik
patent: 5212765 (1993-05-01), Skeirik
patent: 5222403 (1993-06-01), Angelini et al.
patent: 5231939 (1993-08-01), Tanaka et al.
patent: 5251285 (1993-10-01), Inoue et al.
patent: 5280756 (1994-01-01), Labbe
patent: 5282261 (1994-01-01), Skeirik
patent: 5311421 (1994-05-01), Nomura et al.
patent: 5353207 (1994-10-01), Keeler et al.
patent: 5353267 (1994-10-01), Katayama
patent: 5386373 (1995-01-01), Keeler et al.
patent: 5408586 (1995-04-01), Skeirik
patent: 5477444 (1995-12-01), Bhat et al.
patent: 5479573 (1995-12-01), Keeler et al.
patent: 5539638 (1996-07-01), Keeler et al.
patent: 5539639 (1996-07-01), Devaud et al.
patent: 5548528 (1996-08-01), Keeler et al.
patent: 5559690 (1996-09-01), Keeler et al.
patent: 5570282 (1996-10-01), Hansen et al.
patent: 5613041 (1997-03-01), Keeler et al.
patent: 5625750 (1997-04-01), Puskorius et al.
patent: 5640493 (1997-06-01), Skeirik
patent: 5682317 (1997-10-01), Keeler et al.
patent: 5703777 (1997-12-01), Buchhop et al.
patent: 5704111 (1998-01-01), Johnson et al.
patent: 5729661 (1998-03-01), Keeler et al.
patent: 5734796 (1998-03-01), Pao
patent: 5768475 (1998-06-01), Godbole et al.
patent: 5781432 (1998-07-01), Keeler et al.
patent: 5818953 (1998-10-01), Queisser et al.
patent: 5819006 (1998-10-01), Keeler et al.
patent: 5825646 (1998-10-01), Keeler et al.
patent: 5826249 (1998-10-01), Skeirik
patent: 5842189 (1998-11-01), Keeler et al.
patent: 5848402 (1998-12-01), Pao et al.
patent: 5859773 (1999-01-01), Keeler et al.
patent: 5933345 (1999-08-01), Martin et al.
patent: 5950182 (1999-09-01), Godbole et al.
patent: 5970426 (1999-10-01), Mandel et al.
patent: 6002839 (1999-12-01), Keeler et al.
patent: 6047221 (2000-04-01), Piche et al.
patent: 6134537 (2000-10-01), Pao et al.
patent: 6144952 (2000-11-01), Keeler et al.
patent: 6169980 (2001-01-01), Keeler et al.
patent: 6212509 (2001-04-01), Pao et al.
patent: 6216048 (2001-04-01), Keeler et al.
patent: 6243696 (2001-06-01), Keeler et al.
patent: 6278899 (2001-08-01), Piche et al.
patent: 6314414 (2001-11-01), Keeler et al.
patent: 6363289 (2002-03-01), Keeler et al.
patent: 6381504 (2002-04-01), Havener et al.
patent: 6591254 (2003-07-01), Keeler et al.
patent: 6690462 (2004-02-01), Seltzer
patent: 6694796 (2004-02-01), Juneau et al.
patent: 6732055 (2004-05-01), Bagepalli et al.
patent: 6757619 (2004-06-01), Zison et al.
patent: 6810358 (2004-10-01), Lang et al.
patent: 6882929 (2005-04-01), Liang et al.
patent: 6912889 (2005-07-01), Staphanos et al.
patent: 6954701 (2005-10-01), Wolfe
patent: 6975975 (2005-12-01), Fasca
patent: 6983640 (2006-01-01), Staphanos et al.
patent: 7068817 (2006-06-01), Bourg et al.
patent: 7233910 (2007-06-01), Hileman et al.
patent: 0 712 509 (1994-07-01), None
patent: 0 712 463 (2004-07-01), None
patent: WO 95/04878 (1995-02-01), None
patent: WO 95/04957 (1995-02-01), None
patent: WO 03/017042 (2002-08-01), None

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Predictive emissions monitoring method does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Predictive emissions monitoring method, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Predictive emissions monitoring method will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3968351

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.