High frequency delay circuit and test apparatus

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Analysis of complex waves

Reexamination Certificate

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Details

C324S617000, C324S621000, C324S076590, C327S261000, C327S172000

Reexamination Certificate

active

07394238

ABSTRACT:
A high frequency delay circuit operable to output a high frequency signal delayed for a desired delay time. The high frequency delay circuit includes: a variable delay circuit operable to receive a reference signal of which a frequency is lower than the high frequency signal, and to output a delay reference signal delayed from the reference signal for the desired delay time in advance; and a multiplier operable to generate the high frequency signal, of which a frequency is a frequency of the delay reference signal multiplied by a predetermined value, and to output the generated high frequency signal at timing according to a phase of the delay reference signal.

REFERENCES:
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patent: 4374358 (1983-02-01), Hirose
patent: 4710705 (1987-12-01), Kawabata
patent: 5179438 (1993-01-01), Morimoto
patent: 6351756 (2002-02-01), Taniyoshi
patent: 51-60138 (1976-05-01), None
patent: 4-145793 (1992-05-01), None
patent: 09-064702 (1997-03-01), None
patent: 10-163830 (1998-06-01), None
patent: 2001-016097 (2001-01-01), None
patent: 2001-251184 (2001-09-01), None
Patent Abstracts of Japan, Publication No. 04-145793 dated May 19, 1992, 1 page.
Patent Abstracts of Japan, Publication No. 2001-251184 dated Sep. 14, 2001, 1 page.
Patent Abstracts of Japan, Publication No. 2001-016097 dated Jan. 19, 2001, 1 page.
Patent Abstracts of Japan, Publication No. 10-163830 dated Jun. 19, 1998, 1 page.
Patent Abstracts of Japan, Publication No. 09-064702 dated Mar. 7, 1997, 1 page.
International Search Report issued in PCT/JP2004/17553, mailed Jan. 11, 2005, 4 pages.

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