Workpiece handling alignment system

Communications: electrical – Condition responsive indicating system – With particular system function

Reexamination Certificate

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Details

C340S679000, C340S680000, C340S686100, C340S686200, C340S686400, C340S686500

Reexamination Certificate

active

07321299

ABSTRACT:
Method and apparatus for use in setting up workpiece treatment or processing equipment. A disclosed system processes silicon wafers that are treated during processing steps in producing semiconductor integrated circuits. The processing equipment includes a wafer support that supports a wafer in a treatment region during wafer processing. A housing provides a controlled environment within the housing interior for processing the wafer on the wafer support. A mechanical transfer system transports wafers to and from the support. A wafer simulator is used to simulate wafer movement and includes a pressure sensor for monitoring contact between the simulator and the wafer transfer and support equipment. In one illustrated embodiment the wafer simulator is generally circular and includes three equally spaced pressure sensors for monitoring contact with wafer transport and support equipment.

REFERENCES:
patent: 6763281 (2004-07-01), Schauer et al.
patent: 7158857 (2007-01-01), Schauer et al.

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