Substrate assembly, method of testing the substrate...

Details Substrate assembly, method of testing the substrate... Substrate assembly, method of testing the substrate...

2002-06-11

2008-03-11

Hjerpe, Richard (Department: 2629)

Computer graphics processing and selective visual display system

Plural physical display element control system

Display elements arranged in matrix

C345S055000, C345S087000

Reexamination Certificate

active

07342563

ABSTRACT:
The present invention provides a systems and methods to perform an electrical test on a substrate assembly used as a TFT array substrate of a liquid-crystal device without detaching a mounted external IC. The substrate assembly can include a substrate, a peripheral circuit embedded in the substrate, a first wiring arranged on the substrate, and an external IC, mounted on the substrate, and having a first terminal connected to an interconnection portion arranged on the first wiring. The substrate assembly can further include a second wiring which extends from the interconnection portion in such a manner that the second wiring is routed in a portion of the substrate facing the integrated circuit, and a first external circuit connection terminal arranged on the second wiring in a portion of the substrate not facing the integrated circuit. The external IC is thus tested through the external circuit connection terminal.

REFERENCES:
patent: 5945972 (1999-08-01), Okumura et al.
patent: 6750926 (2004-06-01), Ohgiichi et al.
patent: 2002/0116445 (2002-08-01), Huh
patent: 4-242724 (1992-08-01), None
patent: 2000-236005 (2000-08-01), None
patent: 10-2000-0077275 (2000-12-01), None
patent: 2000-0077275 (2000-12-01), None

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