Histogram based testing of analog signals

Details Histogram based testing of analog signals Histogram based testing of analog signals

1997-01-21

1998-08-11

Voeltz, Emanuel Todd

Boots, shoes, and leggings

364490, H04B 116

Patent

active

057936420

ABSTRACT:
A method for evaluating an electrical signal is disclosed. This method is especially useful for evaluating analog signals within an integrated circuit or other inaccessible location. A reference histogram is derived from either a simulation of a desired waveform or from sampling a desired waveform signal. This reference histogram is subtracted from a test results histogram to produce a variance histogram. The variance histogram can be further evaluated to determine characteristics of the electrical signal under test and/or to produce a figure of merit for the circuitry producing the signal under evaluation. Before the difference between the test results histogram and the reference histogram is taken, normalization, offset calculation, gain adjustment, and noise floor adjustment may be performed on the test results histogram, and these values may be exported to further aid in characterization of the signal under evaluation.

REFERENCES:
patent: 4890237 (1989-12-01), Bales et al.
patent: 4985844 (1991-01-01), Foley et al.
patent: 5081592 (1992-01-01), Jenq

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