Static information storage and retrieval – Floating gate – Particular biasing
Reexamination Certificate
2008-03-18
2008-03-18
Pham, Lý Duy (Department: 2827)
Static information storage and retrieval
Floating gate
Particular biasing
C365S185030, C365S185180, C365S185260, C365S185270
Reexamination Certificate
active
10973593
ABSTRACT:
A memory cell with a charge trapping structure is read by measuring current between the substrate region of the memory cell and one of the source region of the memory cell and the drain region of the memory cell. The read operation decreases the coupling between different parts of the charge trapping structure when other parts of the charge trapping structure store data that are not of interest. The sensing window of the memory cell can be greatly improved by this read operation.
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Haynes Beffel & Wolfeld LLP
Macronix International Co. Ltd.
Pham Lý Duy
Suzue Kenta
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