Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2008-04-22
2008-04-22
Hirshfeld, Andrew H (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S071100, C324S691000, C324S713000, C324S717000, C324S722000
Reexamination Certificate
active
11252686
ABSTRACT:
Diamond look-alikes like cubic zirconium, moissanite and other synthetic stones, are distinguishable from nature diamonds based on their thermal and/or electrical conductivities. Germ testers that are on the market are capable of evaluating these two parameters as is the present invention. Electrical resistance of moissanites reaches hundreds of thousands megohms. Existing gem esters use test voltage of 1000 volts, to be able to detect electrical conductivity in most moissanites. Still, reliable detection of high resistance moissanites is difficult. Proposed invention uses significant photo conductivity of moissanites, which was observed by the inventors, to facilitate measurement of electrical conductivity in the toughest gems, to reduce test voltage applied to gems to 300 volts, and to limit electrical test current through a gem to no more than a few micro-amps. Other refinements include: (1) multistep evaluation of electrical conductivity, which avoids applying excessive or unnecessary test voltage and current to a gem, (2) circuit design, which efficiently attenuates AC noise, (3) signal processing, which eliminates industrial pick-up, (4) usage of reference temperature sensor, which improves sensibility and repeatability of thermal measurements.
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Hirshfeld Andrew H
Valone Thomas
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