Sensor and methods for measuring select components in...

Details Sensor and methods for measuring select components in... Sensor and methods for measuring select components in...

2008-01-22

2008-01-22

Toatley, Jr., Gregory J. (Department: 2877)

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

C356S308000, C250S339010

Reexamination Certificate

active

11018167

ABSTRACT:
A sensor for measuring at least selected component in a composition can include: (a) a broadband light source, (b) an acousto-optic tunable filter (AOTF), (c) means for generating a beam of light from the light source and directing the beam of light at the AOTF wherein the AOTF is tuned to pass detection light having a desired wavelength range to detect the presence of the at least one component in the composition, (d) means for directing the detection light of known wavelength to the composition, (e) detection means for receiving light that emerges from the composition, and (f) a control signal generator configured to provide the AOTF with at least one desired wavelength range that is characteristic of the least one component in the composition. As an example, the sensor can be used to measure the thickness of optically transparent films.

REFERENCES:
patent: 4311658 (1982-01-01), Nicoll
patent: 4490845 (1984-12-01), Steinbruegge et al.
patent: 4505550 (1985-03-01), Steinbruegge
patent: 4797246 (1989-01-01), Reinke et al.
patent: 4879471 (1989-11-01), Dahlquist
patent: 4885709 (1989-12-01), Edgar et al.
patent: 5013403 (1991-05-01), Chase
patent: 5039855 (1991-08-01), Kemeny et al.
patent: 5094535 (1992-03-01), Dahlquist et al.
patent: 5166748 (1992-11-01), Dahlquist
patent: 5230923 (1993-07-01), Hirokawa et al.
patent: 5235192 (1993-08-01), Chase et al.
patent: 5276327 (1994-01-01), Bossen et al.
patent: 5438406 (1995-08-01), Puschell
patent: 5444528 (1995-08-01), Puschell
patent: 5541413 (1996-07-01), Pearson et al.
patent: 5606413 (1997-02-01), Bellus et al.
patent: 5795394 (1998-08-01), Belotserkovsky et al.
patent: 5821536 (1998-10-01), Pettit
patent: 5891306 (1999-04-01), Chase et al.
patent: 5965888 (1999-10-01), Engstrom et al.
patent: 6031233 (2000-02-01), Levin et al.
patent: 6262419 (2001-07-01), Huth-Fehre et al.
patent: 6565343 (2003-05-01), Krycki
patent: 6643060 (2003-11-01), Hashimoto et al.
patent: 6780284 (2004-08-01), Almi et al.
patent: 6793854 (2004-09-01), Kirjavainen
patent: 6816636 (2004-11-01), Cole et al.
patent: 6822785 (2004-11-01), Chu et al.
patent: 2004/0124366 (2004-07-01), Zeng et al.
patent: 2004/0246493 (2004-12-01), Kim et al.
patent: 2005/0122529 (2005-06-01), Kim et al.
patent: 10031636 (2002-01-01), None
patent: WO 97/08537 (1997-03-01), None
patent: WO 9902941 (1999-01-01), None
patent: WO 0031521 (2000-06-01), None

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