Metal working – Method of mechanical manufacture – Electrical device making
Reexamination Certificate
2008-04-29
2008-04-29
Kim, Paul D. (Department: 3729)
Metal working
Method of mechanical manufacture
Electrical device making
C029S592100, C029S832000, C029S854000, C324S754090, C324S755090, C324S765010, C438S017000, C438S611000, C438S639000
Reexamination Certificate
active
11336538
ABSTRACT:
A compliant contact structure and contactor card for operably coupling with a semiconductor device to be tested includes a substantially planar substrate with a compliant contact formed therein. The compliant contact structure includes a portion fixed within the substrate and at least another portion integral with the fixed portion, laterally unsupported within a thickness of the substrate and extending beyond a side thereof. Dual-sided compliant contact structures, methods of forming compliant contact structures, a method of testing a semiconductor device and a testing system are also disclosed.
REFERENCES:
patent: 4008300 (1977-02-01), Ponn
patent: 4402562 (1983-09-01), Sado
patent: 4408814 (1983-10-01), Takashi et al.
patent: 5042148 (1991-08-01), Tada et al.
patent: 5172050 (1992-12-01), Swapp
patent: 5476211 (1995-12-01), Khandros
patent: 5665648 (1997-09-01), Little
patent: 5785538 (1998-07-01), Beaman et al.
patent: 5823830 (1998-10-01), Wurster
patent: 5864946 (1999-02-01), Eldridge et al.
patent: 5884398 (1999-03-01), Eldridge et al.
patent: 5926029 (1999-07-01), Ference et al.
patent: 6096636 (2000-08-01), Manning
patent: 6184053 (2001-02-01), Eldridge et al.
patent: 6184065 (2001-02-01), Smith et al.
patent: 6218848 (2001-04-01), Hembree et al.
patent: 6246250 (2001-06-01), Doherty et al.
patent: 6268015 (2001-07-01), Mathieu et al.
patent: 6292003 (2001-09-01), Fredrickson et al.
patent: 6300786 (2001-10-01), Doherty et al.
patent: 6310484 (2001-10-01), Akram et al.
patent: 6337577 (2002-01-01), Doherty et al.
patent: 6366112 (2002-04-01), Doherty et al.
patent: 6466043 (2002-10-01), Khoury et al.
patent: 6475822 (2002-11-01), Eldridge et al.
patent: 7030632 (2006-04-01), Watkins et al.
Kirby Kyle K.
Watkins Charles M.
Kim Paul D.
Micro)n Technology, Inc.
LandOfFree
Method of testing using compliant contact structures,... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method of testing using compliant contact structures,..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of testing using compliant contact structures,... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3941680