Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-05-20
2008-05-20
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S537000, C324S755090, C324S761010
Reexamination Certificate
active
11090900
ABSTRACT:
An electronic element testing apparatus for use with a number of probes. Each probe has a lower pole and an upper pole. The apparatus includes: a first plate having a first side and a second side, the first side having an array of lower pole regions disposed thereabout, each lower pole region configured to receive a lower pole of a probe; and a plurality of signal conductor regions disposed proximate the array of lower pole regions, each signal conductor region arranged to provide a non-cable electrical path between a lower pole region and a switching circuit. The switching circuits are operable to sequentially connect each electronic element to a testing circuit via the upper and lower poles.
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Hsu Chin-Chen
Li Kuang-Jung
Lin Yi-Li
Wu Shyan-I
Chan Emily Y
Mayer & Williams PC
Mayer, Esq. Stuart H.
Nguyen Ha Tran
Vishay General Semiconductor Inc.
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