Radiant energy – Irradiation of objects or material – Irradiation of semiconductor devices
Reexamination Certificate
2008-05-20
2008-05-20
Vanore, David (Department: 2881)
Radiant energy
Irradiation of objects or material
Irradiation of semiconductor devices
C250S492300
Reexamination Certificate
active
10800892
ABSTRACT:
The ion implanting method uses both reciprocatively scanning an ion beam in an X direction and reciprocatively mechanically driving a substrate in a Y direction orthogonal thereto. An implanting step of implanting ions separately for two implanted regions with different dose amounts of the substrate is executed plural times by changing at the center of the substrate a driving speed of the substrate. A rotating step of rotating the substrate around its center by a prescribed angle is executed once during each of the intervals between the respective implanting steps and while the ion beam is not applied to the substrate.
REFERENCES:
patent: 4929840 (1990-05-01), Dykstra et al.
patent: 5393984 (1995-02-01), Glavish
patent: 5811823 (1998-09-01), Blake et al.
patent: 6075249 (2000-06-01), Olson
patent: 6525327 (2003-02-01), Mitchell et al.
patent: 6635880 (2003-10-01), Renau
patent: 6677599 (2004-01-01), Berrian
patent: 6696688 (2004-02-01), White et al.
patent: 6710359 (2004-03-01), Olson et al.
patent: 6750462 (2004-06-01), Iwasawa et al.
patent: 6777695 (2004-08-01), Viviani
patent: 6833552 (2004-12-01), Berrian
patent: 6870170 (2005-03-01), Farley et al.
patent: 7064491 (2006-06-01), Horsky et al.
patent: 3-74040 (1991-03-01), None
patent: 4-22900 (1992-01-01), None
patent: 2000-150407 (2000-05-01), None
patent: 2001-143651 (2001-05-01), None
patent: 2001-185071 (2001-07-01), None
patent: 9610052 (1996-07-01), None
Iwasawa Koji
Nagai Nobuo
Finnegan Henderson Farabow Garrett & Dunner L.L.P.
Nissin Ion Equipment Co., Ltd.
Vanore David
LandOfFree
Ion implanting method and apparatus does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Ion implanting method and apparatus, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Ion implanting method and apparatus will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3935838