Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Reexamination Certificate
2008-05-13
2008-05-13
Hollington, Jermele (Department: 2829)
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
Reexamination Certificate
active
11142323
ABSTRACT:
A semiconductor integrated circuit has a memory operating on a first clock. A memory device captures first output data, being output from the memory in synchronization with the first clock, depending on a second clock having a frequency equal to or less than the first clock. An expected value comparison section, operating on the second clock, compares second output data being output from the memory device and third output data being output from the memory immediately after the output of the first output data with a predetermined expected value.
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Dickinson Wright PLLC
Hollington Jermele
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