System and method for testing the electromagnetic...

Details System and method for testing the electromagnetic... System and method for testing the electromagnetic...

2008-07-08

2008-07-08

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S456000

Reexamination Certificate

active

11581908

ABSTRACT:
A system and method for testing the electromagnetic (EM) susceptibility of an electronic display unit monitors the light emitted from the electronic display unit as EM noise is applied at a particular testing location of the electronic display unit. An error in the electronic display unit caused by the EM noise is detected using an electrical signal generated in response to the light from the electronic display unit.

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patent: 5982190 (1999-11-01), Toro-Lira
patent: 6285207 (2001-09-01), Listwan
patent: 2005/0174140 (2005-08-01), Iwasaki
Kai Wang, Dr. Pommerenke, Jian Min, Zhang, Ranachandran Chundru, “The PCB level ESD immunity study by using 3 Dimension ESD Scan System”, IEEE International Symposium om EMC, Aug. 2004, pp. 343-348.
David Pommerenke, Jayong Koo, Giorgi Muchaidze, “Finding the root cause of an ESC upset event”, DesignCon 2006, Santa Clara, CA, Feb. 2006.

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