Method and apparatus for measuring high-frequency electrical...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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C324S649000, C324S601000, C702S085000

Reexamination Certificate

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11537240

ABSTRACT:
Two ends of a transmission line whose electrical characteristics per unit length are known are connected to associated measurement ports of a network analyzer. A short standard is shunt-connected to at least three points in the longitudinal direction of the transmission line, and electrical characteristics are measured in a short-circuited state, thereby calculating error factors of a measurement system. Then an electronic device to be measured is shunt-connected to the transmission line, and electrical characteristics of the electronic device are measured. Then the error factors of the measurement system are removed from the measured values of the electronic device to be measured, thereby obtaining true values of the electrical characteristics of the electronic device to be measured. Accordingly, a highly accurate high-frequency electrical characteristic measuring method that is not affected by connection variations can be implemented.

REFERENCES:
patent: 4858160 (1989-08-01), Strid et al.
patent: 5159262 (1992-10-01), Rumbaugh et al.
patent: 6838885 (2005-01-01), Kamitani
patent: 6960920 (2005-11-01), Kamitani
patent: 2007/0029990 (2007-02-01), Kamitani
patent: 2007/0040561 (2007-02-01), Kamitani
patent: 6-34686 (1994-02-01), None
patent: 10-197577 (1998-07-01), None
International Search Report issued Apr. 26, 2005.
“In-Fixture Measurements Using Vector Network Analyzers,” Network Analysis pp. 1-32, no date.
Written Opinion, Mar. 29, 2005.

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