Magnetoresistive sensor element and method of assembling...

Electricity: measuring and testing – Magnetic – Magnetometers

Reexamination Certificate

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C324S224000, C324S263000

Reexamination Certificate

active

11360315

ABSTRACT:
A method of performing an on-wafer function testis provided for multiple magnetic field sensor elements on a wafer. Each sensor element includes a magnetic-field-sensitive structure and a current conductor structure. The current conductor structure provides a test magnetic field in response to a test signal, and a change in an electrical characteristic of the respective magnetic-field-sensitive structure is sensed. The functionality of the respective magnetic field sensor element is then evaluated based on electrical characteristic change.

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