Method for testing the quality of a detector module for an...

Details Method for testing the quality of a detector module for an... Method for testing the quality of a detector module for an...

2008-01-01

2008-01-01

Yun, Jurie (Department: 2882)

X-ray or gamma ray systems or devices

Accessory

Testing or calibration

C378S019000, C250S252100

Reexamination Certificate

active

11288377

ABSTRACT:
A method is for testing the quality of a detector module for an x-ray computer tomograph. In order to achieve a quality test of detector modules, it is proposed in at least one embodiment, to fit a holding device with at least one reference detector module and with the detector module to be tested, and subsequently to evaluate both the reference signals supplied by the reference detector module and the test signals supplied by the detector module to be tested.

REFERENCES:
patent: 5473663 (1995-12-01), Hsieh
patent: 6137859 (2000-10-01), Von Der Haar et al.
patent: 6488409 (2002-12-01), Vafi et al.
patent: 7046763 (2006-05-01), Hoffman
patent: 19811044 (1999-04-01), None

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