Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2008-04-22
2008-04-22
Nguyen, Ha Tran (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S761010, C324S072500
Reexamination Certificate
active
11139103
ABSTRACT:
A signal acquisition probe has a double cushioned spring loaded probing tip assembly disposed in a housing. A first compressive element produces a first pre-loaded compressive force and an increasing compressive force on the probing tip assembly and a second compressive element produces a second pre-loaded compressive force and an increasing compressive force on the probing tip assembly subsequent to the first increasing compressive force. First and second double cushioned spring loaded probing tip assemblies may be disposed in a housing to produce a differential signal acquisition probe.
REFERENCES:
patent: 4721903 (1988-01-01), Harsch et al.
patent: 6466000 (2002-10-01), Nightingale
patent: 6677772 (2004-01-01), Faull
patent: 6704670 (2004-03-01), McTigue
patent: 6734689 (2004-05-01), Yang
http://www.candox.co.jp/, Candox Systems, Inc., CP400-04 probe.
Nightingale Mark W.
Yang Kei-Wean C.
Bucher William K.
Chan Emily Y
Nguyen Ha Tran
Tektronix Inc.
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