Gate drive circuit for an insulated gate power transistor

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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C324S765010, C324S762010

Reexamination Certificate

active

11299305

ABSTRACT:
The invention relates to a gate drive circuit for, and in combination with, an insulated gate power transistor. The drive circuit is connected to the gate terminal of the transistor for the purpose of supplying a gate drive signal and being combined with the power transistor in the same chip housing. The drive circuit is set up to carry out a test mode which has been adapted for the purpose of testing the quality of the gate oxide of the power transistor.

REFERENCES:
patent: 5770947 (1998-06-01), Brauchle
patent: 6864702 (2005-03-01), Teggatz et al.
patent: 2004/0051553 (2004-03-01), Manna et al.
patent: 2006/0164114 (2006-07-01), Cirkel et al.
patent: 0 869 370 (2003-07-01), None
patent: WO 95/10785 (1995-04-01), None

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