Systems, devices and methods for thermal testing of an...

Details Systems, devices and methods for thermal testing of an... Systems, devices and methods for thermal testing of an...

2008-07-29

2008-07-29

Wood, Kevin S (Department: 2874)

Optical waveguides

Miscellaneous

C385S134000, C372S034000, C073S865600

Reexamination Certificate

active

11838141

ABSTRACT:
Devices, systems and methods for thermal testing of optoelectronic modules are disclosed. The device includes a frame member, a thermoelectric cooler, a plate in thermal contact with the DUT, a heat sink in thermal contact with the frame, and a metallic clip for attaching the thermal testing device to the module (DUT). The clip secures the thermoelectric cooler to the DUT. The method includes the steps of providing a testing apparatus having a printed circuit board with a test circuit formed thereon. The test board also has an electrical interface disposed in electrical communication with the test circuit, and a thermal testing assembly. A temporary electrical connection is formed between the DUT device and the interface. The thermal testing assembly is used to maintain a test temperature of the DUT device. A data stream is transmitted through the DUT device and then evaluated for adherence to a defined specification.

REFERENCES:
patent: 2005/0025449 (2005-02-01), Dirkson et al.

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