Data processing: measuring – calibrating – or testing – Measurement system – Temperature measuring system
Reexamination Certificate
2007-08-28
2007-08-28
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Temperature measuring system
Reexamination Certificate
active
11325054
ABSTRACT:
Multiple logic cores of integrated circuits and processors may be configured to operate at frequencies and voltages independently of each other. Additionally, other components, such as a common bridge configured to interface with the logic cores, may operate at a voltage and frequency independent of the voltage and frequency at which the logic cores are operating. The operating frequency and/or voltage of a logic core may be independently adjusted for various reasons, including power management and temperature control. Logic circuitry at an interface between the controller and the logic cores may translate logic signals from one voltage and/or frequency to another to enable communication between the bridge and the logic core when the two are operating at different voltages and/or frequencies.
REFERENCES:
patent: 6901303 (2005-05-01), Larson et al.
patent: 7228242 (2007-06-01), Read et al.
patent: 2003/0115013 (2003-06-01), Dendinger
patent: 2006/0161375 (2006-07-01), Duberstein et al.
Hughes William A.
Madrid Philip E.
White Scott A.
Advanced Micro Devices , Inc.
Barlow John
Kowert Robert C.
Meyertons Hood Kivlin Kowert & Goetzel P.C.
Moffat Jonathan
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