Method and apparatus to increase throughput of processing...

Electric heating – Metal heating – By arc

Reexamination Certificate

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C219S121730

Reexamination Certificate

active

10841857

ABSTRACT:
A material processing system and method is disclosed for processing materials such as amorphous silicon in an annealing processes and lithography processes on a silicon wafer, as well as ablation processes. A first laser generates periodic pulses of radiation along a beam path directed at the target material. Similarly, at least one additional laser generates periodic pulses. A beam aligner redirects the beam path of the at least one laser, such that the beam from the at least one additional laser is directed at the target along a path colinear with the first laser's beam path. As a result, all the lasers are directed at the target along the same combined beam path. The periodic pulses of the at least one additional laser are delayed relative to the first laser such that multiple pulses impinge on the target within a single pulse cycle of any given laser.

REFERENCES:
patent: 3496487 (1970-02-01), McFarland et al.
patent: 4773073 (1988-09-01), Warner et al.
patent: 5009486 (1991-04-01), Dobrowolski et al.
patent: 5305334 (1994-04-01), Margalit et al.
patent: 5559338 (1996-09-01), Elliott et al.
patent: 5631737 (1997-05-01), White, III
patent: 5878068 (1999-03-01), Mitarai et al.
patent: 5986742 (1999-11-01), Straaijer et al.
patent: 6088379 (2000-07-01), Owa et al.
patent: 6160832 (2000-12-01), Kleinschmidt et al.
patent: 6229639 (2001-05-01), Ozarski et al.
patent: 6252650 (2001-06-01), Nakamura
patent: 6396856 (2002-05-01), Sucha et al.
patent: 6472295 (2002-10-01), Morris et al.
patent: 6618403 (2003-09-01), Stamm et al.
patent: 6621044 (2003-09-01), Jain et al.
patent: 6850313 (2005-02-01), Ishikawa et al.
patent: 6879617 (2005-04-01), Ariga et al.
patent: 2002/0000426 (2002-01-01), Mead et al.
patent: 2002/0023901 (2002-02-01), Smart
patent: 2002/0085606 (2002-07-01), Ness et al.
patent: 2002/0097761 (2002-07-01), Sucha et al.
patent: 2002/0167581 (2002-11-01), Cordingley et al.
patent: 2003/0155336 (2003-08-01), Kreuter et al.
patent: 2003/0219094 (2003-11-01), Basting et al.
patent: 2005/0031004 (2005-02-01), Basting et al.
patent: 2005/0281306 (2005-12-01), Nakao et al.
patent: 9-148658 (1997-06-01), None
Duffy et al., “Next Generation 193 nm Laser for Sub 100 nm Lithography,” San Diego, CA, Date Unknown, 7 pages.
Paetzel, Rainer, “Comparison Excimer Laser- Solid State Laser,” Goettingen, Germany, Date Unknown, 10 pages.
Patzel, et al., “The New Generation of Excimer Lasers for SubquarterMicron Lithography,” Gottingen, Germany, Date Unknown, 11 pages.

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