Systems and methods for injection of test jitter in data...

Pulse or digital communications – Testing

Reexamination Certificate

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C375S226000

Reexamination Certificate

active

10360159

ABSTRACT:
A method for injecting test jitter in a data bit stream comprises modulating first and second voltage generators to control a rise and fall times of an output signal, respectively. A pair of input voltages are received by a differential pair. At least one current sink device is operated using a first control voltage provided by at least one of the voltage generators to provide an output voltage in response to the input voltages received by the differential pair. A plurality of current sources are operated to provide the output signal using a reference voltage provided by one of the voltage generators in response to the input voltages received by the differential pair, wherein simultaneous variation of the rise and fall times together with the input voltages define the output signal and jitter output by the current sink device and the current sources.

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Laquai, Bernd and Yi Cai, “Testing Gigabit Multilane SerDes Interfaces with Passive Jitter Injection Filters”, 2001 IEEE ITC International Test Conference, Paper 11.1, pp. 297-304.
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