Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-10-23
2007-10-23
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S106000, C375S226000, C370S503000, C331S002000, C331S011000
Reexamination Certificate
active
11279651
ABSTRACT:
A method and apparatus for determining jitter and pulse width from clock signal comparisons provides a low cost and production-integrable mechanism for measuring a clock signal with a reference clock, both of unknown frequency. The measured clock signal is sampled at transitions of a reference clock and the sampled values are collected in a histogram according to a folding of the samples around a timebase which is either swept to detect a minimum jitter for the folded data or is obtained from direct frequency analysis for the sample set. The histogram for the correct estimated period is statistically analyzed to yield the pulse width, which is the difference between the peaks of the probability density function and jitter, which corresponds to width of the density function peaks. Frequency drift is corrected by adjusting the timebase used to fold the data across the sample set.
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Cranford, Jr. Hayden C.
Gebara Fadi H.
Schaub Jeremy D.
Harris Andrew M.
International Business Machines - Corporation
Mitch Harris Atty at Law, LLC
Salys Casimer K.
Tsai Carol S. W.
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