Sensor element for providing a sensor signal, and method for...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters

Reexamination Certificate

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C324S207200, C324S207210, C324S251000

Reexamination Certificate

active

11121846

ABSTRACT:
A method for operating a sensor element having two contact terminal pairs, comprises steps of providing a first measurement value by applying a first controlled variable having a first polarity between the first terminal pair, and coupling the second terminal pair with output terminals; providing a second measurement value by applying a second controlled variable, having an opposed polarity, between the first terminal pair, and coupling the second terminal pair to the output terminals; providing a third measurement value by applying the first variable between the second terminal pair, and coupling the first terminal pair with the output terminals, providing a fourth measurement value by applying the second variable between the second terminal pair, and coupling the first terminal pair with the output terminals; and determining a sensor signal on the basis of a difference between the first and second values and a difference between the third and fourth values.

REFERENCES:
patent: 6262626 (2001-07-01), Bakker et al.
patent: 2002/0047716 (2002-04-01), Maher et al.
patent: 2003/0102909 (2003-06-01), Motz
patent: 0 548 391 (1991-12-01), None
Anton Bakker, et al.; A CMOS Nested-Chopper Instrumentation Amplifier with 100-n V Offset; IFEE Journal of Solid-State Circuits, vol. 35, No. 12, Dec. 2000.
C. Muller-Schwanneke, et al.; Offset Reduction in Silicon Hall Sensors; Sensors and Actuators 8 pp. 18-22, 2000.
Ch. Schott, et al.; Linearizing Integrated Hall Devices; Transducers'97 International Conference on Solid-State Sensors and Actuators, Chicago, IL, Jun. 1997.
P.J.A. Munter; Electronic Circuitry for a Smart Spinning-current Hall Plate with Low Offset; Sensors and Actuators A, 25-27; pp. 747-751, 1991.

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