Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate
2007-12-25
2007-12-25
Rodriguez, Paul (Department: 2123)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Circuit simulation
C716S030000
Reexamination Certificate
active
10345338
ABSTRACT:
A simulation method makes a noise analysis based on parameters including a conductor resistance which takes skin effect into consideration. The simulation method calculates a first resistance of one of conductors having a largest cross sectional area, obtains a predetermined pitch which saturates a diagonal component of a second resistance of a conductor with reference to the first resistance and makes the diagonal component approximately constant, by varying a pitch of the conductors, calculates the parameters for each pitch with respect to one of the pitches larger than or equal to the predetermined pitch and the pitches smaller than the predetermined pitch, and substitutes the parameters calculated for the one of the pitches with respect to the other of the pitches, and outputs calculation results.
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Rivetta et al. teaches a Noise Immunity Analysis of the Forward Hadron Calorimeter, Sep. 2002.
Weeks, W.T., et al., “Resistive and Inductive Skin Effect in Rectangular Conductors”, IBM J. Res. Develop., vol. 23, No. 6, pp. 652-660, Nov. 1979.
Nagata Megumi
Tosaka Masaki
Fujitsu Limited
Pierre-Louis Andre
Rodriguez Paul
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