Test probe with thermally activated grip and release

Details Test probe with thermally activated grip and release Test probe with thermally activated grip and release

2007-02-13

2007-02-13

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S761010

Reexamination Certificate

active

10930183

ABSTRACT:
An electrical test probe has a thermally activated, configurable shape probe tip. At low temperatures, the probe tip is in a generally hooked configuration. Upon heating, the probe tip is converted to a generally straight configuration. The probe tip is composed of a spring component bonded to a shape memory alloy component. The straight configuration allows placement of the probe between tightly spaced circuit pins, while the hooked configuration provides for tight gripping of a circuit pin during measurement.

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Pomona Electronics Data Sheet, Model 6475, Test Probe Tips for 060 Series Probes.
Pomona Electronics Data Sheet, Model 5674b, Deluxe Electronic DMM Test Lead Kit.

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