Method for analyzing measurement data of device under test,...

Details Method for analyzing measurement data of device under test,... Method for analyzing measurement data of device under test,...

2007-02-27

2007-02-27

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

C702S120000

Reexamination Certificate

active

11102259

ABSTRACT:
An operating environment of a measurement apparatus for measuring semiconductor devices under test. In particular, a measurement apparatus for a device under test and a method using the measurement apparatus in which a user can promptly and easily understand the selection of the semiconductor measurement-evaluation application used for measuring the device under test, the setting of parameters used during execution, the display of the execution and the result of the execution, and the programming-related operations.

REFERENCES:
patent: 7043391 (2006-05-01), Miyazaki
Agilent Technologies Product Specification and Description—“New Dimensions in Parametric Analysis”, Oct. 1, 2001, 5988-03707EN; 19 pps.

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