Device for testing semiconductor device

Details Device for testing semiconductor device Device for testing semiconductor device

1991-03-05

1992-08-25

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

371 221, G01R 3128

Patent

active

051422239

ABSTRACT:
A testing device comprises a plurality of pin test portions, each of which is separately provided with a pin pattern controller for controlling the readout of pattern and timing data from pattern and timing memories and a pin instruction memory for storing programs defining the operation procedure of the pin pattern controller. Therefore, the data to be stored in the pattern and timing memories in each of the pin test portions can be in a compressed form, independently of the data to be stored in the pattern and timing memories in the other pin test portions.

REFERENCES:
patent: 3622876 (1971-11-01), Ure et al.
patent: 4945536 (1990-07-01), Hancu
patent: 4989209 (1991-01-01), Littebury et al.

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