Semiconductor device manufacturing: process – With measuring or testing
Reexamination Certificate
2007-02-20
2007-02-20
Nguyen, Tuan H. (Department: 2813)
Semiconductor device manufacturing: process
With measuring or testing
C438S015000, C438S132000
Reexamination Certificate
active
10244910
ABSTRACT:
A method and system for sealing or covering exposed fuses on a semiconductor device are disclosed. A semiconductor device prober incorporating a spray device for applying a sealing compound to individual fuses on a semiconductor device subsequent to testing the semiconductor device is disclosed. A method and system for sealing exposed fuses on a semiconductor device is disclosed which allows the sealing step to be performed either prior to or following singulation of the semiconductor device into individual dice.
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Burraston N. Kenneth
Formfactor, Inc.
Nguyen Tuan H.
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