Semiconductor fuse covering

Semiconductor device manufacturing: process – With measuring or testing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C438S015000, C438S132000

Reexamination Certificate

active

10244910

ABSTRACT:
A method and system for sealing or covering exposed fuses on a semiconductor device are disclosed. A semiconductor device prober incorporating a spray device for applying a sealing compound to individual fuses on a semiconductor device subsequent to testing the semiconductor device is disclosed. A method and system for sealing exposed fuses on a semiconductor device is disclosed which allows the sealing step to be performed either prior to or following singulation of the semiconductor device into individual dice.

REFERENCES:
patent: 4628590 (1986-12-01), Udo et al.
patent: 4795720 (1989-01-01), Kawanabe et al.
patent: 5538924 (1996-07-01), Chen
patent: 5736433 (1998-04-01), Bryant et al.
patent: 6410352 (2002-06-01), Damon et al.
patent: 6479308 (2002-11-01), Eldridge
patent: 6506634 (2003-01-01), Kohyama
patent: 6559042 (2003-05-01), Barth et al.
patent: 2001/0034070 (2001-10-01), Damon et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Semiconductor fuse covering does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Semiconductor fuse covering, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Semiconductor fuse covering will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3875160

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.