Systems and methods for predicting materials properties

Details Systems and methods for predicting materials properties Systems and methods for predicting materials properties

2007-11-06

2007-11-06

Nghiem, Michael (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system

Performance or efficiency evaluation

C702S027000

Reexamination Certificate

active

11122942

ABSTRACT:
Systems and methods for predicting features of materials of interest. Reference data are analyzed to deduce relationships between the input data sets and output data sets. Reference data includes measured values and/or computed values. The deduced relationships can be specified as equations, correspondences, and/or algorithmic processes that produce appropriate output data when suitable input data is used. In some instances, the output data set is a subset of the input data set, and computational results may be refined by optionally iterating the computational procedure. To deduce features of a new material of interest, a computed or measured input property of the material is provided to an equation, correspondence, or algorithmic procedure previously deduced, and an output is obtained. In some instances, the output is iteratively refined. In some instances, new features deduced for the material of interest are added to a database of input and output data for known materials.

REFERENCES:
patent: 6647342 (2003-11-01), Iglesia et al.
patent: 2002/0123848 (2002-09-01), Schneiderman et al.
patent: 2004/0067529 (2004-04-01), Goodman et al.
patent: 2004/0230411 (2004-11-01), Zheng et al.

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