Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-02-06
2007-02-06
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB, C324S701000
Reexamination Certificate
active
10487828
ABSTRACT:
Disclosed is an inspection sensor and inspection apparatus capable of accurately inspecting the shape of a conductive pattern. A sensor element12aincludes an MOSFET, and an aluminum electrode (AL) serving as a passive element80. The passive element or aluminum electrode80is connected to the gate of a MOSFET81and the source of a MOSFET82. A voltage VDD is supplied from a power supply circuit18to the drain of the MOSFET81, and the source of the MOSFET81is connected to the drain of a MOSFET83. A reset signal is entered from a vertical selection section14into the gate of the MOSFET82, and the voltage VDD is supplied from the power supply circuit18to the drain of the MOSFET82. A selection signal is entered from the vertical selection section14into the gate of the MOSFET83, and an output from the source of the MOSFET83is entered into a lateral selection section13.
REFERENCES:
patent: 2959681 (1960-11-01), Noyce
patent: 6097202 (2000-08-01), Takahashi
patent: 6614250 (2003-09-01), Odan et al.
patent: 6734692 (2004-05-01), Fujii et al.
patent: 6798453 (2004-09-01), Kaifu
patent: 2002/0135390 (2002-09-01), Fujii et al.
patent: 2002/0140442 (2002-10-01), Ishioka et al.
patent: 2002/0140448 (2002-10-01), Fujii et al.
patent: 2003/0117164 (2003-06-01), Fujii et al.
patent: 11-153638 (1999-06-01), None
patent: 2001-221824 (2001-08-01), None
patent: 2001-272430 (2001-10-01), None
patent: 2002-22789 (2002-01-01), None
patent: WO 01/63307 (2001-08-01), None
Fujii Tatsuhisa
Ishioka Shogo
Kasai Mikiya
Monden Kazuhiro
Yamaoka Shuji
OHT Inc.
Patel Paresh
Velez Roberto
Westerman, Hattori, Daniels & Adrian , L.L.P.
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