Remote test facility with wireless interface to local test...

Details Remote test facility with wireless interface to local test... Remote test facility with wireless interface to local test...

2007-08-07

2007-08-07

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB, C324S765010, C702S122000, C702S188000, C714S733000, C714S734000, C716S030000

Reexamination Certificate

active

10905199

ABSTRACT:
A central test facility transmits wirelessly test data to a local test facility, which tests electronic devices using the test data. The local test facility transmits wirelessly response data generated by the electronic devices back to the central test facility, which analyzes the response data to determine which electronic devices passed the testing. The central test facility may provide the results of the testing to other entities, such as a design facility where the electronic devices were designed or a manufacturing facility where the electronic devices where manufactured. The central test facility may accept requests for test resources from any of a number of local test facilities, schedule test times corresponding to each test request, and at a scheduled test time, wirelessly transmits test data to a corresponding local test facility.

REFERENCES:
patent: 6236223 (2001-05-01), Brady et al.
patent: 6879940 (2005-04-01), Crist et al.
patent: 2005/0060627 (2005-03-01), Maltseff et al.
patent: 2005/0086021 (2005-04-01), Khandros et al.
patent: 2005/0193294 (2005-09-01), Hildebrant
patent: 2006/0070014 (2006-03-01), Liu et al.

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