Bi-directional buffer for interfacing test system channel

Details Bi-directional buffer for interfacing test system channel Bi-directional buffer for interfacing test system channel

2007-08-28

2007-08-28

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

11018211

ABSTRACT:
An emitter follower or source follower transistor is provided in the channel of a wafer test system between a DUT and a test system controller to enable a low power DUT to drive a test system channel. A bypass resistor is included between the base and emitter of the emitter follower transistor to enable bi-directional signals to be provided between the DUT channel and test system controller, as well as to enable parametric tests to be performed. The emitter follower transistor and bypass resistor can be provided on the probe card, with a pull down termination circuit included in the test system controller. The test system controller can provide compensation for the base to emitter voltage drop of the emitter follower transistor.

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U.S. Appl. No. 10/693,133, filed Oct. 23, 2003, Charles A. Miller.
U.S. Appl. No. 10/937,470, filed Sep. 9, 2004, Charles A. Miller.

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