Phase shift mask including a substrate with recess

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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Reexamination Certificate

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11133233

ABSTRACT:
A phase shift mask includes a quartz substrate having a main surface partially dug, and a Cr film deposited on the main surface. The dug portion includes an undercut provided such that the Cr film partially serves as an eaves, and the Cr film has a π opening exposing a portion of the dug portion, and a first subopening exposing an end of the dug portion.

REFERENCES:
patent: 2005/0058915 (2005-03-01), Uematsu
patent: 2003-344987 (2003-12-01), None

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