Optics: measuring and testing – By light interference – Having light beams of different frequencies
Reexamination Certificate
2007-12-25
2007-12-25
Connolly, Patrick (Department: 2877)
Optics: measuring and testing
By light interference
Having light beams of different frequencies
Reexamination Certificate
active
10421444
ABSTRACT:
Systems and methods are described for obtaining two-wavelength differential-phase holograms. A method includes determining a difference between a filtered analyzed recorded first spatially heterodyne hologram phase and a filtered analyzed recorded second spatially-heterodyned hologram phase.
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Bingham Philip R.
Hanson Gregory R.
Karnowski Thomas P.
Simpson John T.
Voelkl Edgar
Bruckner PC John
Connolly Patrick
UT-Battelle LLC
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