Emulator device including a semiconductor substrate having the e

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324 73R, G06F 1100, G01R 1512

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active

045272344

ABSTRACT:
The present invention is an emulator device for emulation of the functions and operation of a predetermined semiconductor device. A central portion of a semiconductor substrate of the emulator embodies the emulated semiconductor device. This embodiment of the emulated semiconductor device is an exact replica of the emulated device including all input and output connections. The emulator device further includes an additional set of input/output connections located on the periphery of the substrate outside the central portion. These additional input/output connections are connected to portions of the emulated device in the central portion of the substrate. These connections permit additional input signals to be coupled to the emulated device and additional output signals to be received from the device to enable greater control over and monitoring of the emulated device. This periphery preferably also includes further circuits for use in the emulator device for signal conditioning and the like. The preferred embodiment of the emulator further includes an external memory not formed on the same substrate which can be substituted for a similar memory within the emulated device. By this procedure, a program may be tested and debugged prior to embodiment within the emulated device.

REFERENCES:
patent: 4413271 (1983-11-01), Gontowski, Jr. et al.
patent: 4441154 (1984-04-01), McDonough et al.
Semiconductor Wafer Testing-Shultis-IBM TDB, vol. 13, No. 7, Dec. 1970-p. 1793.
Formation of Kerf Metallurgy on Integrated Semiconductor Circuit Wafers-Mania et al.,-IBM TDB, vol. 14, No. 9, pp. 2620-2621, Feb. 1972.
Test Circuit Configuration for Integrated Circuits-IBM TDB, vol. 14, No. 5, Oct. 1971-Freed, pp. 1598-1599.

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