Phase comparing method and apparatus in which a sampled...

Details Phase comparing method and apparatus in which a sampled... Phase comparing method and apparatus in which a sampled...

2007-06-19

2007-06-19

Wachsman, Hal (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S106000, C375S226000

Reexamination Certificate

active

11064023

ABSTRACT:
A phase difference between a first periodic signal, and a sample signal corresponding to a second periodic signal and having a predetermined signal resolution M is calculated in a phase comparing method. The sample signal is obtained by sampling the second periodic signal at a sampling frequency fsfor one signal cycle of the second periodic signal when a frequency of the second periodic signal is not greater than an allowable sampling signal frequency fabequal to fs/M or by conducting at least one of sampling the second periodic signal at fsfor more than one signal cycle of the second periodic signal, and generating interpolated values for the sample signal after sampling the second periodic signal at fsin accordance with whether or not M/N yields a remainder and whether or not N is a prime number when the frequency of the second periodic signal is greater than and is N times fab.

REFERENCES:
patent: 7012862 (2006-03-01), Hiratsuka
patent: 2001/0021059 (2001-09-01), Yariv

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