Method for calibration independent defect correction in an...

Details Method for calibration independent defect correction in an... Method for calibration independent defect correction in an...

2007-11-13

2007-11-13

Lee, Thomas D. (Department: 2625)

Facsimile and static presentation processing

Static presentation processing

Attribute control

C358S504000

Reexamination Certificate

active

10425248

ABSTRACT:
A method for applying defect correction and calibration to image data (100) in an imaging system using an area spatial light modulator (146), where a tone correction LUT (148′) is applied to the image data (100) to apply calibration correction before applying defect correction using a defect map (122) with an accompanying gain table (124). The tone correction LUT (148) is then applied to the image data in the image modulation assembly (140).

REFERENCES:
patent: 1 134 698 (2001-09-01), None
patent: WO 9967743 (1999-12-01), None

Affiliated with

Also associated with

Rating

Method for calibration independent defect correction in an... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method for calibration independent defect correction in an..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method for calibration independent defect correction in an... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3837397