Method of cleaning CVD equipment processing chamber

Cleaning and liquid contact with solids – Processes – Hollow work – internal surface treatment

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C134S001100, C134S022100, C134S031000, C134S902000, C438S905000, C156S345470

Reexamination Certificate

active

10385984

ABSTRACT:
A method of remote plasma cleaning a processing chamber of CVD equipment, which has high cleaning rates, low cleaning operational cost and high efficiency, is provided. The method comprises supplying cleaning gas to the remote plasma-discharge device; activating the cleaning gas inside the remote plasma-discharge device; and bringing the activated cleaning gas into the processing chamber and which is characterized in that a mixed gas of F2gas and an inert gas are used as the cleaning gas. A concentration of the F2gas is 10% or higher. The F2gas, which is a cleaning gas, is supplied to the remote plasma-discharge device from an F2gas cylinder by diluting F2gas at a given concentration by an inert gas.

REFERENCES:
patent: 5709757 (1998-01-01), Hatano et al.
patent: 5788778 (1998-08-01), Shang et al.
patent: 6374831 (2002-04-01), Chandran et al.
patent: 6432255 (2002-08-01), Sun et al.
patent: 2002/0062837 (2002-05-01), Miyanaga et al.
patent: 06-097154 (1994-04-01), None
patent: 10-149989 (1998-06-01), None
H. Pierson. Handbook of Chemical Vapor Deposition (CVD). Noyes Publications, 1992. pp. 150, 248).

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method of cleaning CVD equipment processing chamber does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method of cleaning CVD equipment processing chamber, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method of cleaning CVD equipment processing chamber will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3835462

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.