Data processing: measuring – calibrating – or testing – Measurement system – Measured signal processing
Reexamination Certificate
2007-12-18
2007-12-18
Barlow, Jr., John E. (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system
Measured signal processing
Reexamination Certificate
active
11072099
ABSTRACT:
An apparatus for determining a state parameter of an object to be monitored comprises a means for providing a plurality of measurement values, wherein the measurement values comprise information relating to the state parameter of the object to be monitored, a comparison means for comparing the measurement value to a predeterminable comparison parameter, wherein the comparison means is formed to output a first comparison signal when a predeterminable number of measurement values falls below the comparison parameter within a measurement interval, or to output a second comparison signal when the predeterminable number of measurement values exceeds or reaches the comparison parameter, wherein the first comparison signal or the second comparison signal indicate the state parameter.
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Barlow Jr. John E.
Eschweiler & Associates LLC
Infineon - Technologies AG
Moffat Jonathan
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