Conductivity WSi.sub.2 (tungsten silicide) films by Pt preanneal

Coating processes – Electrical product produced – Condenser or capacitor

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204192C, 204192SP, 427 91, 427 93, 427125, 4271261, 4272552, 4273839, H01L 2124, H01L 21285

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active

043224539

ABSTRACT:
A highly conductive layer utilizing a layer of Pt in conjunction with sputter deposited or co-evaporated WSi.sub.2 to enahnce the conductivity increase of the WSi.sub.2 layer occuring during annealing. The Pt layer is deposited as a thin layer directly on top or beneath the WSi.sub.2 layer or may be incorporated within the WSi.sub.2 layer. During annealing platinum atoms diffuse into the WSi.sub.2 film resulting in lower resistivity values than in comparably deposited annealed film wherein the Pt layer has been omitted.

REFERENCES:
patent: 4180596 (1979-12-01), Crowder et al.
patent: 4218291 (1980-08-01), Fukuyama et al.
Mohammadi et al. "Properties of Sputtered Tungsten Silicide for MOS Integrated Circuit Applications", J. Electrochem Soc.: Solid-State Science _and Technology, vol. 127, No. 2, Feb. 1980, pp. 450-454.
Sinha, "Electrical Characteristics and Thermal Stability of Platinum Silicide-to-Silicon Ohmic Contacts Metallized with Tungsten" J. Electrochem. Soc: Solid State Science and Technology, vol. 120, No. 12, Dec. 1973, pp. 1767-1771.

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