Test pattern of semiconductor device and test method using...

Details Test pattern of semiconductor device and test method using... Test pattern of semiconductor device and test method using...

2007-01-09

2007-01-09

Hollington, Jermele (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

11028784

ABSTRACT:
There are provided a test pattern of a semiconductor device and a test method using the same. The test pattern of the semiconductor device includes a conductive pattern disposed on a semiconductor substrate, and the conductive pattern includes a plurality of line regions, which are aligned in parallel, and spaced at a uniform interval, and a plurality of connecting regions for connecting the plurality of line regions in a zigzag shape. The test pattern includes a plurality of transistors electrically switching first ends of the adjacent line regions corresponding to the connecting region, and each transistor includes a source region, which is electrically connected to one end of one of the adjacent line regions, and a drain region, which is electrically connected to one end of the other one of the adjacent line regions. Further, a transistor selecting part is electrically connected to gates of the plurality of transistors, for selecting one of the plurality of transistors or a combination thereof.

REFERENCES:
patent: 5485095 (1996-01-01), Bertsch et al.
patent: 5561367 (1996-10-01), Goettling et al.
patent: 5834795 (1998-11-01), Lee
patent: 5877631 (1999-03-01), Takahashi
patent: 6509739 (2003-01-01), Voogel et al.
patent: 6960785 (2005-11-01), Jin et al.
patent: 2003/0102474 (2003-06-01), Wang
patent: 02-56291 (2002-07-01), None

Affiliated with

Also associated with

Rating

Test pattern of semiconductor device and test method using... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test pattern of semiconductor device and test method using..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test pattern of semiconductor device and test method using... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3820589