Assisted scratch removal

Image analysis – Image transformation or preprocessing – Convolution

Reexamination Certificate

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Details

C382S190000

Reexamination Certificate

active

09900479

ABSTRACT:
Line defects are removed from an image by providing image data in digital form, analyzing segments of the image data as groups of pixels, detecting line defects in the image by application of a line detector, such as a local radial angular transform, and adjusting the image data to correct the detected line defects within the determined limits.

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