Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-01-02
2007-01-02
Patel, Paresh (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C257S048000
Reexamination Certificate
active
11228391
ABSTRACT:
A test pattern includes a test wiring pattern on a lower surface of a substrate. First, second, third and fourth upper patterns are formed on an upper surface of the substrate. First, second, third and fourth electrodes are formed respectively on the first, second, third and fourth upper patterns. The first and second electrodes are for connection to first and second test probes. First and second via-holes are formed through the substrate respectively to connect the first and second upper patterns electrically to one end of the test wiring pattern. Third and fourth via-holes are formed through the substrate respectively to connect the third and fourth upper patterns electrically to another end of the test wiring pattern.
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Oki Electric Industry Co., Ltd
Patel Paresh
Rabin & Berdo P.C.
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