Optics: measuring and testing – By light interference
Reexamination Certificate
2007-09-11
2007-09-11
Turner, Samuel A. (Department: 2877)
Optics: measuring and testing
By light interference
C356S499000
Reexamination Certificate
active
10838619
ABSTRACT:
An optoelectronic detector system is for generating a plurality of periodic, phase-shifted scanning signals from the scanning of a periodic fringe pattern. The fringe pattern extends in a detection plane with fringe-pattern period P in a fringe-displacement direction. The detector system is made up of a plurality of detector elements, the geometrical shape of the detector elements being selected such that a defined filtering of unwanted harmonics from the scanning signals thereby results. Within one fringe-pattern period P, a total of N detector elements of the same geometrical shape are arranged one immediately after the other in measuring direction x.
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Dr. Johannes Heidenhain GmbH
Turner Samuel A.
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