Process parameter based I/O timing programmability using...

Details Process parameter based I/O timing programmability using... Process parameter based I/O timing programmability using...

2007-01-02

2007-01-02

Raymond, Edward (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C714S025000

Reexamination Certificate

active

10679724

ABSTRACT:
Electrical fuses (eFuses) are applied to the task of achieving very tightly controlled Input-Output (I/O) timing specifications. The I/O timing is made programmable and subject to adjustment as part of wafer probe testing. The techniques of parametric adjustment presented are based upon what is commonly referred to as clock skewing or clock tuning. The invention describes methods to select the clock skewing on a die-to-die basis based on functional testing with the actual parametric limits imposed on parameters of interest. The results associated with each die form the basis for hard-programming the selected clock skew value into the die via electrical fuses.

REFERENCES:
patent: 2002/0004926 (2002-01-01), Erickson

Affiliated with

Also associated with

Rating

Process parameter based I/O timing programmability using... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Process parameter based I/O timing programmability using..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Process parameter based I/O timing programmability using... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3801536