Method and apparatus to perform on-die waveform capture

Details Method and apparatus to perform on-die waveform capture Method and apparatus to perform on-die waveform capture

2007-09-25

2007-09-25

Bui, Bryan (Department: 2863)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Electrical signal parameter measurement system

C702S070000, C702S124000

Reexamination Certificate

active

10743349

ABSTRACT:
An integrated circuit is provided that includes a first port to receive a first signal from a first channel and a first device coupled to the first port to modify a channel response of the first signal received from the first channel. A waveform capture device may be coupled to the first device to capture a waveform of a signal modified by the first device.

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