Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2007-01-02
2007-01-02
Nguyeh, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S761010
Reexamination Certificate
active
10510615
ABSTRACT:
An opening5ais formed in a part of a high strength base plate5for providing electroconductive contact units, and a holder hole forming member7made of plastic material is filled into the opening via an insulating film6. Holder holes2are formed in the holder hole forming member, and a coil spring8and electroconductive needle members9and10are installed in each holder hole. Because the proportion of the reinforcing material in the thickness of the holder is so high that the contact probe holder can be made almost as strong as the high strength base plate. Thus, even when the thickness of the holder is minimized, the mechanical strength of the holder can be ensured as opposed to the conventional arrangement including a simply insert molded metallic member, and the holder can be made even thinner.
REFERENCES:
patent: 4322682 (1982-03-01), Schadwill
patent: 4423376 (1983-12-01), Byrnes et al.
patent: 5521523 (1996-05-01), Kimura et al.
patent: 5804984 (1998-09-01), Alcoe et al.
patent: 6051982 (2000-04-01), Alcoe et al.
patent: 2002/0123252 (2002-09-01), Yu et al.
patent: 60-168062 (1985-08-01), None
patent: 01 213579 (1989-08-01), None
patent: 8-201427 (1996-08-01), None
patent: 8-271547 (1996-10-01), None
patent: 2001-223247 (2001-08-01), None
patent: WO 98/11446 (1998-03-01), None
patent: WO 00/03250 (2000-01-01), None
English Language Abstract, Japanese Publication No. 60-168062, Published Aug. 31, 1985, 1 p.
English Language Abstract, Japanese Publication No. 8-201427, Published Aug. 9, 1996, 1 p.
English Language Abstract, Japanese Publication No. 8-271547, Published Oct. 18, 1996, 1 p.
English Language Abstract, Japanese Publication No. 2001-223247, Published Aug. 17, 2001, 1 p.
Microfilm of the specification and drawings annexed to the request of Japanese Utility Model Application No. 36820/1989 (Laid-open No. 128961/1990) (Tsuneo Kasahara), Oct. 24, 1990, Fig. 1.
Microfilm of the specification and drawings annexed to the request of Japanese Utility Model Application No. 93110/1990 (Laid-open No. 51663/1992) (Organ Needle Co., Ltd.), Apr. 30, 1992, Fig. 8.
English Language Abstract, Japanese Publication No. JP1213579, Aug. 28, 1989, 1 page.
MacPherson Kwok & Chen & Heid LLP
Nguyeh Vinh P.
NHK Spring Co. Ltd.
Park David S.
LandOfFree
Planar electroconductive contact probe holder does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Planar electroconductive contact probe holder, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Planar electroconductive contact probe holder will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3795221